3 edition of Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems found in the catalog.
Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems
by U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, Order from National Technical Information Service in Gaithersburg, MD, [Springfield, VA
Written in English
|Other titles||Standard reference materials., Antireflecting chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems., Standard reference materials.|
|Statement||Carol F. Vezzetti, Ruth N. Varner, James E. Potzick.|
|Series||NIST special publication -- 260-119.|
|Contributions||Varner, Ruth N., Potzick, James E., National Institute of Standards and Technology (U.S.)|
|The Physical Object|
What is an LD50?
Internet handbook for law librarians
The Kings Singers Lennon and McCartney Collection
guide to doing business in Ontario.
Northwest coast Indian art
review, taxation of vending machine sales
Health Departments of Los Angeles County, Pasadena, Vernon, and Long Beach
Broadening the homosexual experience
Introductory Topics in Electronics and Telecommunications (Introductory Topics in Electronics & Telecommunication)